Key Features - Generation


  • Supports both MAC and PHY layer signal configuration
  • Frame Formats: Singlecast Frame, Multicast Frame, Acknowledgement Frame, etc.
  • Payload Types: PN Sequence, User Defined Bits, Test Pattern and From File
  • Supports multiple frames with user configurable inter frame spacing
  • Impairments: AWGN, IQ Impairments (Gain Imbalance, Quadrature Skew and IQ offset), Frequency Offset and Clock Offset


Key Features - Analysis


  • Frequency Deviation measurements
  • Frequency Offset
  • IQ Offset (Carrier Leakage)
  • Transmit Power
  • Spectral Emission Mask and offset channel power measurements
  • Demodulated Bits
  • Physical Layer Payload bits (PPDU)
  • MAC Payload Bits (MPDU)
  • Packet Error Rate Measurement (PER)
  • Supported Traces
    • Constellation Trace
    • Measured and Reference I vs Time and Q vs Time
    • Power vs Time Trace
    • Spectral Emission Mask Trace



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Getting Started Guide - 3.1MB
Data Sheet - 1.0MB
Help - 0.5MB
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Z-Wave Measurement Suite


Z-Wave is a low-power, low-cost wireless technology enabling consumer-grade products with networked features. Z-Wave is based on ITU-T G.9959 standard.Z-Waveoperates in the industrial, scientific and medical (ISM) radio bands: It uses 868.42 MHz in Europe and 908.42MHz in USA. MaxEye Technologies provides generation and analysis functions in LabVIEW for generating and analyzing the ITU-T G.9959 standard complaint signals using National Instruments Vector Signal Generators (NI VSG) and Vector Signal Analyzers (NI VSA) or Vector Signal Transceivers (NI VST)./p>
Click to enlarge

The standard defines different modulation types, data rates based on the frequency band.

Data Rate Bit Rate Symbol Rate Modulation Type Coding Frequency Offset Separation
R1 9.6 kbps 19.2 kbaud FSK Manchester 20 kHz 40kHz±20%
R2 40 kbps 40 kbaud FSK NRZ 0 kHz 40kHz±20%
R3 100 kbps 100 kbaud GFSK NRZ 0 kHz 58kHz±20%

This toolkit is used to test, measure and analyze the performance of Z-Wave transmitters operating in ISM bands. The design validation and verification stage of development requires more intensive analysis tools such as constellation plot to debug various issues in product design. The production test requires more definitive measurements such as EVM and Frequency Offset so you can compare performance to test limits.


Applications

  • Z-Wave Manufacturing Test
  • Z-Wave RF and Physical Layer Test
  • Design and Validation Test


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Key Features - Generation


  • Supports both MAC and PHY layer signal configuration
  • Frame Formats: Singlecast Frame, Multicast Frame, Acknowledgement Frame, etc.
  • Payload Types: PN Sequence, User Defined Bits, Test Pattern and From File
  • Supports multiple frames with user configurable inter frame spacing
  • Impairments: AWGN, IQ Impairments (Gain Imbalance, Quadrature Skew and IQ offset), Frequency Offset and Clock Offset


Key Features - Analysis


  • Frequency Deviation measurements
  • Frequency Offset
  • IQ Offset (Carrier Leakage)
  • Transmit Power
  • Spectral Emission Mask and offset channel power measurements
  • Demodulated Bits
  • Physical Layer Payload bits (PPDU)
  • MAC Payload Bits (MPDU)
  • Packet Error Rate Measurement (PER)
  • Supported Traces
    • Constellation Trace
    • Measured and Reference I vs Time and Q vs Time
    • Power vs Time Trace
    • Spectral Emission Mask Trace



Product Brochure - 0.4MB
Getting Started Guide - 3.1MB
Data Sheet - 1.0MB
Help - 0.5MB
Request for Quotation

More Downloads


More Videos


Products




Solutions




Services