Key Features - Generation


  • Supports both MAC and PHY layer signal configuration
  • Supports DFT Sizes: 128,64,32,16
  • Frame Formats: Beacon, Data, Acknowledgement and MAC Command Frame
  • Payload Types: PN Sequence, User Defined Bits, Test Pattern and From File
  • Supports multiple frames with user configurable inter frame spacing
  • Impairments: AWGN, IQ Impairments (Gain Imbalance, Quadrature Skew and IQ offset), Frequency Offset and Clock Offset


Key Features - Analysis


  • Error Vector Magnitude (EVM) measurements
  • Frequency Offset
  • Modulation Error Ration (MER)
  • Magnitude and Phase Error
  • IQ Gain Imbalance, Quadrature Skew
  • Transmit Power
  • Spectral Emission Mask and offset channel power measurements
  • Demodulated Bits
  • Physical Layer Payload bits (PPDU)
  • MAC Payload Bits (MPDU)
  • Packet Error Rate Measurement (PER)
  • Supported Traces
    • Constellation Trace
    • EVM vs Symbols Trace
    • EVM vs Subcarriers Trace



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Wi-SUN Measurement Suite


Wi-SUN is the short form of Wireless Smart Utility Network and promoted by Wi-SUN Alliance. Wi-SUN Alliance is a consortium of Global Corporations and World Leaders in Smart Utility, Smart City and Internet of Things Markets. Wi-SUN network is developed as per IEEE 802.15.4g which defines PHY and MAC layer specifications. Wi-SUN brings Smart Ubiquitous Networks to service providers, utilities, local government and other enterprises, by enabling interoperable, multi-service & secure wireless mesh networks.


MAXEYE Technologies provides generation and analysis functions in LabVIEW and .NET for generating and analyzing the Wi-SUN standard complaint signals using National Instruments Vector Signal Generators (NI VSG) and Vector Signal Analyzers (NI VSA) or Vector Signal Transceivers (NI VST).


MaxEye Wi-SUN Measurements Suite


The IEEE 802.15.4g Standard supports multiple Physical Layer modes; the current version of the toolkit supports the MR-OFDM physical layer.




The standard defines different modulation types, data rates based on the DFT Size.


Parameter OFDM Option 1 OFDM Option 2 OFDM Option 3 OFDM Option 4
Normal bandwidth (KHz) 1094 552 281 156
Channel spacing (KHz) 1200 800 400 200
DFT size 128 64 32 16
Active tones 104 52 26 14
# Plot tones 8 4 2 2
# Data tones 96 48 24 12
MCS0 (kb/s) (BPSK rate 1/2 with 4x frequency reception) 100 50 - -
MCS1 (kb/s) (BPSK rate 1/2 with 2x frequency reception) 200 100 50 -
MCS2 (kb/s) (QPSK rate 1/2 and 2x frequency reception) 400 200 100 50
MCS3 (kb/s) (QPSK rate 1/2) 800 400 200 100
MCS4 (kb/s) (QPSK rate 3/4) - 600 300 150
MCS5 (kb/s) (16-QAM rate 1/2) - 800 400 200
MCS6 (kb/s) (16-QAM rate 3/4) - - 600 300

The design validation and verification stage of development requires more intensive analysis tools such as constellation plot to debug various issues in product design. The production test requires more definitive measurements such as EVM and Frequency Offset so you can compare performance to test limits.


Applications

  • Wi-SUN Manufacturing Test
  • Wi-SUN RF and Physical Layer Testing
  • Design and Validation




Also visit: National Instruments website to Buy Our Products Online.


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Key Features - Generation


  • Supports both MAC and PHY layer signal configuration
  • Supports DFT Sizes: 128,64,32,16
  • Frame Formats: Beacon, Data, Acknowledgement and MAC Command Frame
  • Payload Types: PN Sequence, User Defined Bits, Test Pattern and From File
  • Supports multiple frames with user configurable inter frame spacing
  • Impairments: AWGN, IQ Impairments (Gain Imbalance, Quadrature Skew and IQ offset), Frequency Offset and Clock Offset


Key Features - Analysis


  • Error Vector Magnitude (EVM) measurements
  • Frequency Offset
  • Modulation Error Ration (MER)
  • Magnitude and Phase Error
  • IQ Gain Imbalance, Quadrature Skew
  • Transmit Power
  • Spectral Emission Mask and offset channel power measurements
  • Demodulated Bits
  • Physical Layer Payload bits (PPDU)
  • MAC Payload Bits (MPDU)
  • Packet Error Rate Measurement (PER)